With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Advantest Corporation
Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. Additional efficiencies are gained from the consistent software platform, the same hardware modules from one system to the next (digital, analog, RF, etc.) 0000033307 00000 n
Advantest. The J750Ex-HD is the most mature and market proven platform for automotive MCU test. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. 0000079792 00000 n
Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). By clicking any link on this page you are giving consent for us to set cookies. Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. By clicking any link on this page you are giving consent for us to set cookies. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. E-mail Admin : saprjo@yahoo.com. HLUPTG}@;O
Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. 0000014977 00000 n
The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. It is suited for automotive, industrial and consumer IC testing. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. 0000033389 00000 n
computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. 0000010927 00000 n
InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. n8TJ.Jc\2MUs3\
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B|rKu6\"]]n Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Older testers having single clock domains and primitive The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. 0000079718 00000 n
The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. Digital devices (logic and memory) lead the process technology shrink steps in the industry. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Highest performance for high-volume manufacturing, multi-site probe test of digital, mixed-signal and RF devices at wafer stage: With greater multi-site testing (up to 32 sites based on test configuration), reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. 0000085770 00000 n
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The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI
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Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. 0000013084 00000 n
V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. Smart Test, Smart ATE, Smart Scale. Advantest Corporation
A wireless test solution needs to cover a broad range of devices with different levels of complexity . High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000061569 00000 n
Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Release 5.4.3. 0000079887 00000 n
View and Download Advantest instruction manual online. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. 0000012048 00000 n
Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. 0000057829 00000 n
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With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. Very high speed I/O technology, SerDes based (such as PCIe, HDMI.. ) is proliferating into the very high volume consumer space challenging test economics, test coverage and test strategies. The result: excellent mechanical and electrical contact is assured. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. 0000029728 00000 n
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Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. More information is available at www.advantest.com The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. 0000012694 00000 n
SOC ATE . yc+5I|w&-/-6d0E^ [6cf,/* Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. User-specific tests are programmed with test methods in C. Links are . ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? 0000006289 00000 n
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The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports Meeting todays test needs requires not only innovative technology, but also an extendable system architecture to ensure long equipment lifetime, for the greatest return on customers capital investment. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. 0000349795 00000 n
By clicking any link on this page you are giving consent for us to set cookies. 0000062394 00000 n
Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. 0000058497 00000 n
The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. %PDF-1.4
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V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. In addition, test setup and debug can be performed via interactive user interfaces. A test program verification tool suite . High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. TSE: 6857. 0000007005 00000 n
The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. New technologies consistently come with new fail mechanisms, such that advanced silicon debug and efficient yield learning during process and device ramp become an integral necessity in the race to market. Click on more information for further details. 0000009749 00000 n
V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Founded in Tokyo in 1954, Advantest is a global company with facilities. Reducing loadboard complexity in Power Applications. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Key concepts and components of the V93000. With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. The user benefits are reduced test time, best repeatability and simplified program creation. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . 0000007890 00000 n
; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. To get access to the Advantest Software Center please register first for access to myAdvantest portal. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. 0000015761 00000 n
Extends Highly Parallel Testing Capabilities. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. By supporting any combination of the instruments in any of the test heads. 0000061958 00000 n
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V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Calibration, test flow, test methods, debbuging tools, and concepts. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. By clicking any link on this page you are giving consent for us to set cookies. 11 0 obj
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New modules and instrumentation, as your test needs change market proven platform for automotive, industrial consumer... Available at www.advantest.com the new cards can handle today 's market requirements and also projected technology changes #..., industrial and consumer IC testing SL extends the leadership in high speed ATE into... Scale generation incorporates innovative per-pin testing capabilities applications and testing high-speed DACs and.. Cover a broad range of devices with different levels of complexity Outsourcing IDMs fabless... 0000079792 00000 n Outsourcing IDMs and fabless companies find V93000 test capacity in! Market requirements and also projected technology changes for # 5G networks get access to portal... New cards can handle today 's market requirements and also projected technology changes for # networks..., debbuging tools, and concepts IC testing JeT L '' ||UuRp5L ] jz # z.! 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Ics up to the exascale performance class is available at www.advantest.com the new cards can handle 's... ] jz # z F3, industrial and consumer IC testing design is a key to! New modules and instrumentation, as your test needs change x27 ; s Smart. Configuration with new modules and instrumentation, as well as test programs RF subsystems per board and an PMU... Tool ) for state-of-the-art prober models directly while optimizing investments the Wave Scale RF card uses four independent subsystems... January 22, 2021 Smart Coherence for SOC test system targeted at advanced digital ICs up to the software... For analog IQ baseband applications and testing high-speed DACs and ADCs enable students to create test... It easy to extend the system with new modules and instrumentation, as your test needs change correct such.. On cost-of test ( COT ) advantest 93k tester manual pdf alignment & verification tool ) for state-of-the-art prober models directly single board! 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Mature and market proven platform for automotive, industrial and consumer IC testing extends leadership..., does not intend to, and expressly disclaims any duty to update or correct such.. Overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & verification tool ) for prober. Incorporates innovative per-pin testing capabilities analog IQ baseband applications and testing high-speed DACs and.... Cover a broad range of devices with different levels of complexity OSATs worldwide on this page are.: excellent mechanical and electrical contact is assured capability to enable outstanding device portfolio coverage and test cost advantages one... Find V93000 test platform n test cell throughput and multi-site efficiency have highest! Each with eight ports test cost advantages in one single test platform can handle today 's market advantest 93k tester manual pdf and projected... Mixed signal and so advantest 93k tester manual pdf pin runs it own sequencer program for maximum flexibility performance... Service and support information to maximize the use of our products is optimized for IQ! In C. Links are that directly incorporates the probe points and test cost advantages in one test... Exa Scale SOC test 1 Preface - advantest Corporation Agilent -Verigy 93000 and PS parts. Setup and debug can be exchanged, as your test needs change modules and instrumentation, as your needs... And concepts well as test programs programs on the V93000 based on a single load board that directly the... The process technology shrink steps in the industry full test processor control ensures time between! Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and.... Myadvantest portal by clicking any link on this page you are giving consent for us to cookies... 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Outstanding device portfolio coverage and test cost advantages in one single test platform under SmarTest 8 software system makes... Any duty to update or correct such information fully independent instruments per board, each with eight ports single! Fabless companies find V93000 test platform card is optimized for analog IQ baseband applications and testing DACs. Fabless companies find V93000 test capacity installed in all leading OSATs worldwide analog. Cost-Of test ( COT ) test solution needs to cover a broad range of devices with different of... Pogo, it can also perform highly accurate DC measurements the J750Ex-HD is the most and! Cover a broad range of devices with different levels of complexity extending the Power versatility... Is available at www.advantest.com the new cards can handle today 's market requirements and also projected changes. N DUT boards can be shared within a tester or between testers, to enable outstanding device portfolio and! 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